Beschrijving
Features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, “Exploring the Many Facets of Failure Analysis”.
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
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Garand, M.
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Danièle Bott
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Hachisu, Nancy Singleton
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James Hoffmann
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Annie Griffiths
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Jean-Michel Guesdon || Philippe Margotin
€ 37,80

Jacques Cavallier-Belletrud || Lionel Paillès || Aurore de la Morinerie
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DK Travel
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Sarah J. Maas
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DK
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