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Proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format. Contents include: Advanced techniques Packaging Backside analysis Scanning probe microscopy Focused ion beam (FIB) techniques Failure analysis of micro-electromechanical systems (MEMS) Yield improvement Discretes Defect-based testing Case histories.

Boekdetails

Formaat
Multiple-component retail product
Uitgever
ASM International
Imprint
ASM International
Auteur
ASM International, ASM International
ISBN-13
9780871707468
Verschijningsdatum
2001-12-00
Afmetingen
156 mm × 230 mm

Multiple-component retail product

ISTFA 2001: International Symposium for Testing and Failure Analysis

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